Scanning Probe Microscopy Electrical and Electromechanical...

Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale

Kalinin, Sergei V., Gruverman, Alexei
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This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs.
Kategori:
Tahun:
2006
Penerbit:
Springer
Bahasa:
english
Halaman:
1002
ISBN 10:
0387286683
ISBN 13:
9780387286686
File:
PDF, 36.92 MB
IPFS:
CID , CID Blake2b
english, 2006
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