New Horizons in Testing. Latent Trait Test Theory and...

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New Horizons in Testing. Latent Trait...

New Horizons in Testing. Latent Trait Test Theory and Computerized Adaptive Testing

David J. Weiss

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Kategori:

Business & Economics

Tahun:

1983

Edisi:

1

Penerbit:

Elsevier Inc, Academic Press

Bahasa:

english

Halaman:

345

ISBN 10:

0127427805

ISBN 13:

9780127427805

File:

PDF, 16.87 MB

IPFS:

,

english, 1983

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